Energy band offsets of dielectrics on InGaZnO4

Corrigendum to “Amorphous semiconductor mobility limits” [J. Non-Cryst. Solids 432 (2016) 196–199]

(2017) K.A. Stewart et al.   JOURNAL OF NON-CRYSTALLINE SOLIDS

Suppression of photo-bias induced instability for amorphous indium tungsten oxide thin film transistors with bi-layer structure

(2016) Po-Tsun Liu et al.   APPLIED PHYSICS LETTERS

Improving positive and negative bias illumination stress stability in parylene passivated IGZO transistors

(2016) Asal Kiazadeh et al.   APPLIED PHYSICS LETTERS

Effect of interfacial excess oxygen on positive-bias temperature stress instability of self-aligned coplanar InGaZnO thin-film transistors

(2016) Saeroonter Oh et al.   APPLIED PHYSICS LETTERS

Transparent field-effect transistors based on AlN-gate dielectric and IGZO-channel semiconductor

(2016) C. Besleaga et al.   APPLIED SURFACE SCIENCE

Impact of Native Defects in the High Dielectric Constant Oxide HfSiO4on MOS Device Performance

(2016) Hai-Kuan Dong et al.   CHINESE PHYSICS LETTERS

Modification of band alignments and optimization of electrical properties of InGaZnO MOS capacitors with high-k HfOxNy gate dielectrics

(2016) C.Y. Zheng et al.   JOURNAL OF ALLOYS AND COMPOUNDS

Multi-state extrapolation of UV/Vis absorption spectra with QM/QM hybrid methods

(2016) Sijin Ren et al.   JOURNAL OF CHEMICAL PHYSICS

Device instability of amorphous InGaZnO thin film transistors with transparent source and drain

(2016) Sang Min Kim et al.   MICROELECTRONICS RELIABILITY

Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with transparent source and drain

(2016) Jong Hoon Lee et al.   MICROELECTRONICS RELIABILITY

Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability

(2016) Michael J. Mutch et al.   MICROELECTRONICS RELIABILITY

Analytical approximation of the InGaZnO thin-film transistors surface potential

(2016) Luigi Colalongo   SOLID-STATE ELECTRONICS

Band alignment and defect states in amorphous GaInZnO thin films grown on SiO2/Si substrates

(2016) Sung Heo et al.   SURFACE AND INTERFACE ANALYSIS

Band alignment in ZrSiO 4 /ZnO heterojunctions

(2016) David C. Hays et al.   VACUUM

Valence and Conduction Band Offsets in Sputtered LaAlO 3 /InGaZnO 4 Heterostructures

(2016) David C. Hays et al.   ECS Journal of Solid State Science and Technology

Effect of Surface Defect States on Valence Band and Charge Separation and Transfer Efficiency

(2016) Juan Xu et al.   Scientific Reports

A transparent diode with high rectifying ratio using amorphous indium-gallium-zinc oxide/SiNx coupled junction

(2015) Myung-Jea Choi et al.   APPLIED PHYSICS LETTERS

Spectroscopic investigations of band offsets of MgO|AlxGa1-xN epitaxial heterostructures with varying AlN content

(2015) Elizabeth A. Paisley et al.   APPLIED PHYSICS LETTERS

Publisher's Note: “Defect-induced bandgap narrowing in low-k dielectrics” [Appl. Phys. Lett. 107, 082903 (2015)]

(2015) X. Guo et al.   APPLIED PHYSICS LETTERS

Mobility enhancement in crystalline In-Ga-Zn-oxide with In-rich compositions

(2015) Kazuhiro Tsutsui et al.   APPLIED PHYSICS LETTERS

High mobility, dual layer, c-axis aligned crystalline/amorphous IGZO thin film transistor

(2015) Chen-Yang Chung et al.   APPLIED PHYSICS LETTERS

The effect of annealing in forming gas on the a-IGZO thin film transistor performance and valence band cut-off of IGZO on SiNx

(2015) Raj Kamal et al.   CURRENT APPLIED PHYSICS

Modification of band offsets of InGaZnO 4 /Si heterojunction through nitrogenation treatment

(2015) X.F. Chen et al.   JOURNAL OF ALLOYS AND COMPOUNDS

Band offsets in HfTiO/InGaZnO4 heterojunction determined by X-ray photoelectron spectroscopy

(2015) G. He et al.   JOURNAL OF ALLOYS AND COMPOUNDS

Characterization of negative bias-illumination-stress stability for transparent top-gate In-Ga-Zn-O thin-film transistors with variations in the incorporated oxygen content

(2015) Kyeong-Ah Kim et al.   JOURNAL OF APPLIED PHYSICS

Energy band alignment in chalcogenide thin film solar cells from photoelectron spectroscopy

(2015) Andreas Klein   JOURNAL OF PHYSICS-CONDENSED MATTER

IGZO thin film transistors with Al2O3 gate insulators fabricated at different temperatures

(2015) Xingwei Ding et al.   MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

ZrSiO x /IGZO heterojunctions band offsets determined by X-ray photoelectron spectroscopy

(2015) David C. Hays et al.   VACUUM

Valence and conduction band offsets in sputtered HfO2/InGaZnO4 heterostructures

(2015) David C. Hays et al.   VACUUM

Flexible indium–gallium–zinc–oxide Schottky diode operating beyond 2.45 GHz

(2015) Jiawei Zhang et al.   Nature Communications

Band gap and defect states of MgO thin films investigated using reflection electron energy loss spectroscopy

(2015) Sung Heo et al.   AIP Advances

Impact of the Low Temperature Gate Dielectrics on Device Performance and Bias-Stress Stabilities of a-IGZO Thin-Film Transistors

(2015) M. Nag et al.   ECS Journal of Solid State Science and Technology

Origin of the Alternative Current (AC-) Gate Bias Improving the NBIS Stability of IGZO TFTs

(2015) M. P. Hung et al.   ECS Solid State Letters

Hysteresis of Transistor Characteristics of Amorphous IGZO TFTs Studied by Controlling Measurement Speed

(2015) Y.-J. Chen et al.   ECS Solid State Letters

Optical properties and bandgap evolution of ALD HfSiOx films

(2015) Wen Yang et al.   Nanoscale Research Letters

Probing deeper by hard x-ray photoelectron spectroscopy

(2014) P. Risterucci et al.   APPLIED PHYSICS LETTERS

Positive Gate Bias Instability Induced by Diffusion of Neutral Hydrogen in Amorphous In-Ga–Zn-O Thin-Film Transistor

(2014) Kay Domen et al.   IEEE ELECTRON DEVICE LETTERS

Improved Performance of Amorphous InGaZnO Thin-Film Transistor With $\hbox{Ta}_{2}\hbox{O}_{5}$ Gate Dielectric by Using La Incorporation

(2014) L. X. Qian et al.   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Comparison of High-$\kappa~{\rm Gd}_{2}{\rm O}_{3}$ and ${\rm GdTiO}_{3}~\alpha$-InGaZnO Thin-Film Transistors

(2014) Tung-Ming Pan et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Metal-insulator transitions in IZO, IGZO, and ITZO films

(2014) Kazumasa Makise et al.   JOURNAL OF APPLIED PHYSICS

Measurement of bandgap energies in low-k organosilicates

(2014) M. T. Nichols et al.   JOURNAL OF APPLIED PHYSICS

Density of states of amorphous In-Ga-Zn-O from electrical and optical characterization

(2014) Eric Kai-Hsiang Yu et al.   JOURNAL OF APPLIED PHYSICS

Positive-Bias Stress Test on Amorphous In–Ga–Zn–O Thin Film Transistor: Annealing-Temperature Dependence

(2014) Kay Domen et al.   Journal of Display Technology

Band Offsets in YSZ/InGaZnO4 Heterostructure System

(2014) J. K. Kim et al.   JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY

Measurement of Band Offsets in Y2O3/InGaZnO4 Heterojunctions

(2014) Jong Cheon Park et al.   JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY

A study on the electrical characteristics of InGaZnO thin-film transistor with HfLaO gate dielectric annealed in different gases

(2014) L.X. Qian et al.   MICROELECTRONICS RELIABILITY

Intrinsic energy band alignment of functional oxides

(2014) Shunyi Li et al.   Physica Status Solidi-Rapid Research Letters

Tuning the electronic and structural properties of WO3 nanocrystals by varying transition metal tungstate precursors

(2014) Sara Rahimnejad et al.   RSC Advances

Roles of Hydrogen in Amorphous Oxide Semiconductor In-Ga-Zn-O: Comparison of Conventional and Ultra-High-Vacuum Sputtering

(2014) Takaya Miyase et al.   ECS Journal of Solid State Science and Technology

Vapor-Induced Improvements in Field Effect Mobility of Transparent a-IGZO TFTs

(2014) Mami N. Fujii et al.   ECS Journal of Solid State Science and Technology

Improvement of Negative Bias Temperature Illumination Stability of Amorphous IGZO Thin-Film Transistors by Water Vapor-Assisted High-Pressure Oxygen Annealing

(2014) Byung Du Ahn et al.   ECS Journal of Solid State Science and Technology

High performance InGaZnO thin film transistor with InGaZnO source and drain electrodes

(2013) Hung-Chi Wu et al.   APPLIED PHYSICS LETTERS

Hydrogen passivation of electron trap in amorphous In-Ga-Zn-O thin-film transistors

(2013) Yuichiro Hanyu et al.   APPLIED PHYSICS LETTERS

An amorphous oxide semiconductor thin-film transistor route to oxide electronics

(2013) John F. Wager et al.   CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE

Detection of defect states in low-k dielectrics using reflection electron energy loss spectroscopy

(2013) S.W. King et al.   JOURNAL OF APPLIED PHYSICS

Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends

(2013) Ville Miikkulainen et al.   JOURNAL OF APPLIED PHYSICS

Heterojunction band offsets and dipole formation at BaTiO3/SrTiO3 interfaces

(2013) Snjezana Balaz et al.   JOURNAL OF APPLIED PHYSICS

Detection of surface electronic defect states in low and high-k dielectrics using reflection electron energy loss spectroscopy

(2013) Benjamin L. French et al.   JOURNAL OF MATERIALS RESEARCH

Instability of light illumination stress on amorphous In-Ga-Zn-O thin-film transistors

(2013) Suehye Park et al.   Journal of the Society for Information Display

Band offsets, Schottky barrier heights, and their effects on electronic devices

(2013) John Robertson   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A

Fully room-temperature IGZO thin film transistors adopting stacked gate dielectrics on flexible polycarbonate substrate

(2013) Hsiao-Hsuan Hsu et al.   SOLID-STATE ELECTRONICS

Low Operation Voltage InGaZnO Thin Film Transistors with LaAlO3Gate Dielectric Incorporation

(2013) Z. W. Zheng et al.   ECS Journal of Solid State Science and Technology

Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances

(2012) E. Fortunato et al.   ADVANCED MATERIALS

Atomic layer deposition of Sc2O3 for passivating AlGaN/GaN high electron mobility transistor devices

(2012) Xinwei Wang et al.   APPLIED PHYSICS LETTERS

Band offsets in HfO2/InGaZnO4 heterojunctions

(2012) Hyun Cho et al.   APPLIED PHYSICS LETTERS

Band offsets in ZrO2/InGaZnO4 heterojunction

(2012) Jianke Yao et al.   APPLIED PHYSICS LETTERS

Energy band alignment of InGaZnO4/Si heterojunction determined by x-ray photoelectron spectroscopy

(2012) Zhang-Yi Xie et al.   APPLIED PHYSICS LETTERS

An Investigation of the Different Charge Trapping Mechanisms for SiNx and SiO2 Gate Insulator in a-IGZO TFTs

(2012) Young Wook Lee et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Highly Reliable Depletion-Mode a-IGZO TFT Gate Driver Circuits for High-Frequency Display Applications Under Light Illumination

(2012) Binn Kim et al.   IEEE ELECTRON DEVICE LETTERS

Performance Variation According to Device Structure and the Source/Drain Metal Electrode of a-IGZO TFTs

(2012) Sang Ho Rha et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Structural relaxation in amorphous oxide semiconductor, a-In-Ga-Zn-O

(2012) Keisuke Ide et al.   JOURNAL OF APPLIED PHYSICS

Band alignment of InGaZnO4/Si interface by hard x-ray photoelectron spectroscopy

(2012) Kyeongmi Lee et al.   JOURNAL OF APPLIED PHYSICS

The Surface Chemistry of Atomic Layer Depositions of Solid Thin Films

(2012) Francisco Zaera   Journal of Physical Chemistry Letters

A Study of the Surface Chemical Reactions on IGZO Thin Film in BCl3/Ar Inductively Coupled Plasma

(2012) Young-Hee Joo et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Analyzing the effects of ambient dependence for InGaZnO TFTs under illuminated bias stress

(2012) Te-Chih Chen et al.   SURFACE & COATINGS TECHNOLOGY

Reflection electron energy loss spectroscopy for ultrathin gate oxide materials

(2012) Hye Chung Shin et al.   SURFACE AND INTERFACE ANALYSIS

Measurement of SiO2/InZnGaO4 heterojunction band offsets by x-ray photoelectron spectroscopy

(2011) E. A. Douglas et al.   APPLIED PHYSICS LETTERS

Highest transmittance and high-mobility amorphous indium gallium zinc oxide films on flexible substrate by room-temperature deposition and post-deposition anneals

(2011) Mandar J. Gadre et al.   APPLIED PHYSICS LETTERS

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

(2011) Te-Chih Chen et al.   APPLIED PHYSICS LETTERS

Al2O3∕InGaZnO4 Heterojunction Band Offsets by X-Ray Photoelectron Spectroscopy

(2011) Hyun Cho et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Review paper: Transparent amorphous oxide semiconductor thin film transistor

(2011) Jang-Yeon Kwon et al.   Electronic Materials Letters

An Interactive Simulation Tool for Complex Multilayer Dielectric Devices

(2011) R G Southwick et al.   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Electrical and Photosensitive Characteristics of a-IGZO TFTs Related to Oxygen Vacancy

(2011) Jianke Yao et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Quantitative Calculation of Oxygen Incorporation in Sputtered IGZO Films and the Impact on Transistor Properties

(2011) Seyeoul Kwon et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Limits to doping in oxides

(2011) J. Robertson et al.   PHYSICAL REVIEW B

The status and perspectives of metal oxide thin-film transistors for active matrix flexible displays

(2011) Jae Kyeong Jeong   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Review of recent developments in amorphous oxide semiconductor thin-film transistor devices

(2011) Joon Seok Park et al.   THIN SOLID FILMS

Energy band alignment at interfaces of semiconducting oxides: A review of experimental determination using photoelectron spectroscopy and comparison with theoretical predictions by the electron affinity rule, charge neutrality levels, and the common anion rule

(2011) Andreas Klein   THIN SOLID FILMS

n-Type Organic Semiconductors in Organic Electronics

(2010) John E. Anthony et al.   ADVANCED MATERIALS

Effects of ambient atmosphere on the transfer characteristics and gate-bias stress stability of amorphous indium-gallium-zinc oxide thin-film transistors

(2010) Sang-Yun Sung et al.   APPLIED PHYSICS LETTERS

High-Performance a-IGZO Thin-Film Transistor Using $ \hbox{Ta}_{2}\hbox{O}_{5}$ Gate Dielectric

(2010) C. J. Chiu et al.   IEEE ELECTRON DEVICE LETTERS

High-Performance a-IGZO TFT With $\hbox{ZrO}_{2}$ Gate Dielectric Fabricated at Room Temperature

(2010) Jae Sang Lee et al.   IEEE ELECTRON DEVICE LETTERS

Empirical Modeling and Extraction of Parasitic Resistance in Amorphous Indium–Gallium–Zinc Oxide Thin-Film Transistors

(2010) Jun-Hyun Park et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Complete band offset characterization of the HfO2/SiO2/Si stack using charge corrected x-ray photoelectron spectroscopy

(2010) E. Bersch et al.   JOURNAL OF APPLIED PHYSICS

Measurement of optical constants of Si and SiO2 from reflection electron energy loss spectra using factor analysis method

(2010) H. Jin et al.   JOURNAL OF APPLIED PHYSICS

Initiation of a passivated interface between hafnium oxide and In(Ga)As(0 0 1)−(4×2)

(2010) Jonathon B. Clemens et al.   JOURNAL OF CHEMICAL PHYSICS

Energy band alignment between Pb(Zr,Ti)O3and high and low work function conducting oxides—from hole to electron injection

(2010) F Chen et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Present status of amorphous In–Ga–Zn–O thin-film transistors

(2010) Toshio Kamiya et al.   SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS

Thin-Film Transistors

(2009) Robert A. Street   ADVANCED MATERIALS

Reliability of Organic Field-Effect Transistors

(2009) Henning Sirringhaus   ADVANCED MATERIALS

Band structure and valence-band offset of HfO2 thin film on Si substrate from photoemission spectroscopy

(2009) Tingting Tan et al.   APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING

Impact of oxide defects on band offset at GeO2/Ge interface

(2009) M. Yang et al.   APPLIED PHYSICS LETTERS

Growth of homoepitaxial SrTiO3 thin films by molecular-beam epitaxy

(2009) C. M. Brooks et al.   APPLIED PHYSICS LETTERS

Environmental stability of candidate dielectrics for GaN-based device applications

(2009) A. M. Herrero et al.   JOURNAL OF APPLIED PHYSICS

In situspectroscopic ellipsometry as a versatile tool for studying atomic layer deposition

(2009) E Langereis et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Toward High-Performance Amorphous GIZO TFTs

(2009) P. Barquinha et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Evaluation of Y2O3 gate insulators for a-IGZO thin film transistors

(2009) Young-Je Cho et al.   THIN SOLID FILMS

Double gate GaInZnO thin film transistors

(2008) Hyuck Lim et al.   APPLIED PHYSICS LETTERS

Defect passivation and homogenization of amorphous oxide thin-film transistor by wet O2 annealing

(2008) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

High performance indium gallium zinc oxide thin film transistors fabricated on polyethylene terephthalate substrates

(2008) Wantae Lim et al.   APPLIED PHYSICS LETTERS

Processing effects on the stability of amorphous indium gallium zinc oxide thin-film transistors

(2008) Hai Q. Chiang et al.   JOURNAL OF NON-CRYSTALLINE SOLIDS

Optical and Carrier Transport Properties of Cosputtered Zn–In–Sn–O Films and Their Applications to TFTs

(2008) Kachirayil J. Saji et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

High-Performance Indium Gallium Zinc Oxide Transparent Thin-Film Transistors Fabricated by Radio-Frequency Sputtering

(2008) Wantae Lim et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Thermal stability of zircon (ZrSiO4)

(2008) Arno Kaiser et al.   JOURNAL OF THE EUROPEAN CERAMIC SOCIETY

Optical and electrical properties of amorphous zinc tin oxide thin films examined for thin film transistor application

(2008) Madambi K. Jayaraj et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

Zn-In-O based thin-film transistors: Compositional dependence

(2008) N. Itagaki et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Band offsets of ultrathin high-κoxide films with Si

(2008) Eric Bersch et al.   PHYSICAL REVIEW B

Amorphous oxide channel TFTs

(2007) Hideya Kumomi et al.   THIN SOLID FILMS