Empirical Modeling and Extraction of Parasitic Resistance in Amorphous Indium–Gallium–Zinc Oxide Thin-Film Transistors

Published 2010 View Full Article

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Title
Empirical Modeling and Extraction of Parasitic Resistance in Amorphous Indium–Gallium–Zinc Oxide Thin-Film Transistors
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 58, Issue 8, Pages 2796-2799
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2010-11-10
DOI
10.1109/ted.2010.2084580

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