Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

Published 2008 View Full Article

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Title
Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 93, Issue 12, Pages 123508
Publisher
AIP Publishing
Online
2008-09-26
DOI
10.1063/1.2990657
References
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