Band structure and valence-band offset of HfO2 thin film on Si substrate from photoemission spectroscopy

Published 2009 View Full Article

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Title
Band structure and valence-band offset of HfO2 thin film on Si substrate from photoemission spectroscopy
Authors
Keywords
-
Journal
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume 97, Issue 2, Pages 475-479
Publisher
Springer Nature
Online
2009-05-05
DOI
10.1007/s00339-009-5245-8

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