Effects of ambient atmosphere on the transfer characteristics and gate-bias stress stability of amorphous indium-gallium-zinc oxide thin-film transistors

Charge pumping method for photosensor application by using amorphous indium-zinc oxide thin film transistors

(2009) Po-Tsun Liu et al.   APPLIED PHYSICS LETTERS

Origins of threshold voltage shifts in room-temperature deposited and annealed a-In–Ga–Zn–O thin-film transistors

(2009) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Gate-bias stress in amorphous oxide semiconductors thin-film transistors

(2009) M. E. Lopes et al.   APPLIED PHYSICS LETTERS

Toward High-Performance Amorphous GIZO TFTs

(2009) P. Barquinha et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Transfer characteristics and bias-stress stability of amorphous indium zinc oxide thin-film transistors

(2009) Jun Hyuk Choi et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

High performance indium gallium zinc oxide thin film transistors fabricated on polyethylene terephthalate substrates

(2008) Wantae Lim et al.   APPLIED PHYSICS LETTERS

High-performance amorphous gallium indium zinc oxide thin-film transistors through N2O plasma passivation

(2008) Jaechul Park et al.   APPLIED PHYSICS LETTERS

Low voltage operating InGaZnO4 thin film transistors using high-k MgO–Ba0.6Sr0.4TiO3 composite gate dielectric on plastic substrate

(2008) Dong Hun Kim et al.   APPLIED PHYSICS LETTERS

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

(2008) A. Suresh et al.   APPLIED PHYSICS LETTERS

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

(2008) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS

Threshold Voltage Control of Amorphous Gallium Indium Zinc Oxide TFTs by Suppressing Back-Channel Current

(2008) Kyoung-Seok Son et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Bottom-Gate Gallium Indium Zinc Oxide Thin-Film Transistor Array for High-Resolution AMOLED Display

(2008) Jang Yeon Kwon et al.   IEEE ELECTRON DEVICE LETTERS

Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses

(2008) In-Tak Cho et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY