Origin of the Alternative Current (AC-) Gate Bias Improving the NBIS Stability of IGZO TFTs

Published 2015 View Full Article

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Title
Origin of the Alternative Current (AC-) Gate Bias Improving the NBIS Stability of IGZO TFTs
Authors
Keywords
-
Journal
ECS Solid State Letters
Volume 4, Issue 12, Pages Q66-Q68
Publisher
The Electrochemical Society
Online
2015-11-10
DOI
10.1149/2.0101512ssl

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