Measurement of SiO2/InZnGaO4 heterojunction band offsets by x-ray photoelectron spectroscopy

Title
Measurement of SiO2/InZnGaO4 heterojunction band offsets by x-ray photoelectron spectroscopy
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 98, Issue 24, Pages 242110
Publisher
AIP Publishing
Online
2011-06-15
DOI
10.1063/1.3600340

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