Band alignment of InGaZnO4/Si interface by hard x-ray photoelectron spectroscopy

Band offsets in HfO2/InGaZnO4 heterojunctions

(2012) Hyun Cho et al.   APPLIED PHYSICS LETTERS

Measurement of SiO2/InZnGaO4 heterojunction band offsets by x-ray photoelectron spectroscopy

(2011) E. A. Douglas et al.   APPLIED PHYSICS LETTERS

Highly stable amorphous In-Ga-Zn-O thin-film transistors produced by eliminating deep subgap defects

(2011) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Direct Observation of Hole Current in Amorphous Oxide Semiconductors under Illumination

(2011) Yoon Jang Chung et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Al2O3∕InGaZnO4 Heterojunction Band Offsets by X-Ray Photoelectron Spectroscopy

(2011) Hyun Cho et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Depth analysis of subgap electronic states in amorphous oxide semiconductor, a-In-Ga-Zn-O, studied by hard x-ray photoelectron spectroscopy

(2011) Kenji Nomura et al.   JOURNAL OF APPLIED PHYSICS

Photovoltaic properties of n-type amorphous In–Ga–Zn–O and p-type single crystal Si heterojunction solar cells: Effects of Ga content

(2011) Kyeongmi Lee et al.   THIN SOLID FILMS

Subgap states, doping and defect formation energies in amorphous oxide semiconductor a-InGaZnO4 studied by density functional theory

(2010) Toshio Kamiya et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Present status of amorphous In–Ga–Zn–O thin-film transistors

(2010) Toshio Kamiya et al.   SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS

First-principles study of native point defects in crystalline indium gallium zinc oxide

(2009) Hideyuki Omura et al.   JOURNAL OF APPLIED PHYSICS

Hard X-ray photoemission spectroscopy

(2009) Keisuke Kobayashi   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

Subgap states in transparent amorphous oxide semiconductor, In–Ga–Zn–O, observed by bulk sensitive x-ray photoelectron spectroscopy

(2008) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Valence band offset of ZnO/Zn0.85Mg0.15O heterojunction measured by x-ray photoelectron spectroscopy

(2008) S. C. Su et al.   APPLIED PHYSICS LETTERS

Modeling of amorphous InGaZnO4 thin film transistors and their subgap density of states

(2008) Hsing-Hung Hsieh et al.   APPLIED PHYSICS LETTERS

Specific contact resistances between amorphous oxide semiconductor In–Ga–Zn–O and metallic electrodes

(2007) Yasuhiro Shimura et al.   THIN SOLID FILMS