Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

Mechanism analysis of photoleakage current in ZnO thin-film transistors using device simulation

(2010) Mutsumi Kimura et al.   APPLIED PHYSICS LETTERS

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

(2010) Te-Chih Chen et al.   APPLIED PHYSICS LETTERS

Analysis of subthreshold photo-leakage current in ZnO thin-film transistors using indium-ion implantation

(2010) Yudai Kamada et al.   SOLID-STATE ELECTRONICS

Gate-bias stress in amorphous oxide semiconductors thin-film transistors

(2009) M. E. Lopes et al.   APPLIED PHYSICS LETTERS

Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors

(2009) Jae-Heon Shin et al.   ETRI JOURNAL

Two-dimensional numerical simulation of radio frequency sputter amorphous In–Ga–Zn–O thin-film transistors

(2009) Tze-Ching Fung et al.   JOURNAL OF APPLIED PHYSICS

Toward High-Performance Amorphous GIZO TFTs

(2009) P. Barquinha et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

(2008) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS

Bottom-Gate Gallium Indium Zinc Oxide Thin-Film Transistor Array for High-Resolution AMOLED Display

(2008) Jang Yeon Kwon et al.   IEEE ELECTRON DEVICE LETTERS