Material processing, performance and reliability of MoS2 field effect transistor (FET) technology- A critical review

Title
Material processing, performance and reliability of MoS2 field effect transistor (FET) technology- A critical review
Authors
Keywords
-
Journal
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 160, Issue -, Pages 107397
Publisher
Elsevier BV
Online
2023-03-01
DOI
10.1016/j.mssp.2023.107397

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