Charge trapping at the MoS2-SiO2 interface and its effects on the characteristics of MoS2 metal-oxide-semiconductor field effect transistors
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Title
Charge trapping at the MoS2-SiO2 interface and its effects on the characteristics of MoS2 metal-oxide-semiconductor field effect transistors
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 106, Issue 10, Pages 103109
Publisher
AIP Publishing
Online
2015-03-14
DOI
10.1063/1.4914968
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