Control of O-H bonds at a-IGZO/SiO2 interface by long time thermal annealing for highly stable oxide TFT
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Title
Control of O-H bonds at a-IGZO/SiO2 interface by long time thermal annealing for highly stable oxide TFT
Authors
Keywords
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Journal
AIP Advances
Volume 7, Issue 12, Pages 125110
Publisher
AIP Publishing
Online
2017-12-12
DOI
10.1063/1.5008435
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