Light/negative bias stress instabilities in indium gallium zinc oxide thin film transistors explained by creation of a double donor

Title
Light/negative bias stress instabilities in indium gallium zinc oxide thin film transistors explained by creation of a double donor
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 101, Issue 12, Pages 123502
Publisher
AIP Publishing
Online
2012-09-18
DOI
10.1063/1.4752238

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