Comparative Studies of Long-Term Ambiance and Electrical Stress Stability of IGZO Thin-Film Transistors Annealed Under Hydrogen and Nitrogen Ambiance

Published 2016 View Full Article

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Title
Comparative Studies of Long-Term Ambiance and Electrical Stress Stability of IGZO Thin-Film Transistors Annealed Under Hydrogen and Nitrogen Ambiance
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 63, Issue 5, Pages 1910-1915
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2016-04-09
DOI
10.1109/ted.2016.2545742

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