A Review on Resistive Switching in High-k Dielectrics: A Nanoscale Point of View Using Conductive Atomic Force Microscope
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Title
A Review on Resistive Switching in High-k Dielectrics: A Nanoscale Point of View Using Conductive Atomic Force Microscope
Authors
Keywords
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Journal
Materials
Volume 7, Issue 3, Pages 2155-2182
Publisher
MDPI AG
Online
2014-03-14
DOI
10.3390/ma7032155
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