Grain boundary-driven leakage path formation in HfO2 dielectrics

Published 2011 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Grain boundary-driven leakage path formation in HfO2 dielectrics
Authors
Keywords
-
Journal
SOLID-STATE ELECTRONICS
Volume 65-66, Issue -, Pages 146-150
Publisher
Elsevier BV
Online
2011-07-23
DOI
10.1016/j.sse.2011.06.031

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.