Review—Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High- k Dielectrics: Beryllium Oxide, Aluminum Oxide, Hafnium Oxide, and Aluminum Nitride

标题
Review—Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High- k Dielectrics: Beryllium Oxide, Aluminum Oxide, Hafnium Oxide, and Aluminum Nitride
作者
关键词
-
出版物
ECS Journal of Solid State Science and Technology
Volume 6, Issue 10, Pages N189-N208
出版商
The Electrochemical Society
发表日期
2017-10-06
DOI
10.1149/2.0091710jss

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