Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography

Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography

(2016) Katherine P. Rice et al.   MICROSCOPY AND MICROANALYSIS

Atom probe tomography of nanoscale electronic materials

(2016) D.J. Larson et al.   MRS BULLETIN

Advances in atom probe tomography instrumentation: Implications for materials research

(2016) Michael P. Moody et al.   MRS BULLETIN

Cross-sectional atom probe tomography sample preparation for improved analysis of fins on SOI

(2016) Andrew J. Martin et al.   ULTRAMICROSCOPY

Three-dimensional quantification of composition and electrostatic potential at individual grain boundaries in doped ceria

(2016) David R. Diercks et al.   Journal of Materials Chemistry A

Improved Mass Resolving Power and Yield in Atom Probe Tomography

(2016) D.J. Larson et al.   MICROSCOPY AND MICROANALYSIS

Towards Atom Probe Tomography of Hybrid Organic-Inorganic Nanoparticles

(2016) L.M. Gordon et al.   MICROSCOPY AND MICROANALYSIS

Direct Experimental Measurement of Grain Boundary's Five-Parameters and Solute Segregations at Atomic Level

(2016) L. Yao et al.   MICROSCOPY AND MICROANALYSIS

Atom Probe Tomographic Mapping Directly Reveals the Atomic Distribution of Phosphorus in Resin Embedded Ferritin

(2016) Daniel E. Perea et al.   Scientific Reports

Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques

(2015) A. Grenier et al.   APPLIED PHYSICS LETTERS

Techniques for Transmission EBSD Mapping of Atom Probe Specimens

(2015) Katherine P. Rice et al.   MICROSCOPY AND MICROANALYSIS

Integrated APT/t-EBSD for Grain Boundary Analysis of Thermally Grown Oxide on a Ni-Based Superalloy

(2015) Y. Chen et al.   MICROSCOPY AND MICROANALYSIS

Methodology exploration of specimen preparation for atom probe tomography from nanowires

(2015) Jiangtao Qu et al.   ULTRAMICROSCOPY

HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy

(2015) W. Lefebvre et al.   ULTRAMICROSCOPY

Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography

(2015) M. Herbig et al.   ULTRAMICROSCOPY

Grain boundary study of technically pure molybdenum by combining APT and TKD

(2015) K. Babinsky et al.   ULTRAMICROSCOPY

New approaches to nanoparticle sample fabrication for atom probe tomography

(2015) P. Felfer et al.   ULTRAMICROSCOPY

Encapsulation method for atom probe tomography analysis of nanoparticles

(2015) D.J. Larson et al.   ULTRAMICROSCOPY

Revealing the Distribution of the Atoms within Individual Bimetallic Catalyst Nanoparticles

(2014) Peter Felfer et al.   ANGEWANDTE CHEMIE-INTERNATIONAL EDITION

Specimen-thickness effects on transmission Kikuchi patterns in the scanning electron microscope

(2014) K.P. RICE et al.   JOURNAL OF MICROSCOPY

Atom-probe analyses of nanodiamonds from Allende

(2014) Philipp R. Heck et al.   METEORITICS & PLANETARY SCIENCE

Preparation of nanowire specimens for laser-assisted atom probe tomography

(2014) H Blumtritt et al.   NANOTECHNOLOGY

Atomic-Scale Quantification of Grain Boundary Segregation in Nanocrystalline Material

(2014) M. Herbig et al.   PHYSICAL REVIEW LETTERS

Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features

(2014) Matthew I. Hartshorne et al.   ULTRAMICROSCOPY

In situ determination of misorientation angle of grain boundary by field ion microscopy analysis

(2014) Jun Takahashi et al.   ULTRAMICROSCOPY

A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction

(2014) K. Babinsky et al.   ULTRAMICROSCOPY

Atom probe tomography spatial reconstruction: Status and directions

(2013) D.J. Larson et al.   CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE

Elaboration and characterization of Cu/Co multilayered nanowires

(2013) Julien Bran et al.   JOURNAL OF THE KOREAN PHYSICAL SOCIETY

Ni silicide nanowires analysis by atom probe tomography

(2013) M. El Kousseifi et al.   MICROELECTRONIC ENGINEERING

Three-Dimensional Mapping of Quantum Wells in a GaN/InGaN Core–Shell Nanowire Light-Emitting Diode Array

(2013) James R. Riley et al.   NANO LETTERS

Dopant characterization in self-regulatory plasma doped fin field-effect transistors by atom probe tomography

(2012) H. Takamizawa et al.   APPLIED PHYSICS LETTERS

Focused ion beam fabrication of solidified ferritin into nanoscale volumes for compositional analysis using atom probe tomography

(2012) M.E. GREENE et al.   JOURNAL OF MICROSCOPY

3-D Atomic-Scale Mapping of Manganese Dopants in Lead Sulfide Nanowires

(2012) Dieter Isheim et al.   Journal of Physical Chemistry C

Local electrode atom probe analysis of silicon nanowires grown with an aluminum catalyst

(2012) Chad M Eichfeld et al.   NANOTECHNOLOGY

Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope

(2012) Patrick W. Trimby   ULTRAMICROSCOPY

Atom probe analysis of interfacial abruptness and clustering within a single InxGa1−xN quantum well device on semipolar (101¯1¯) GaN substrate

(2011) T. J. Prosa et al.   APPLIED PHYSICS LETTERS

Laser-assisted atom probe tomography investigation of magnetic FePt nanoclusters: First experiments

(2011) E. Folcke et al.   JOURNAL OF ALLOYS AND COMPOUNDS

Depth and lateral resolution of laser-assisted atom probe microscopy of silicon revealed by isotopic heterostructures

(2011) Y. Shimizu et al.   JOURNAL OF APPLIED PHYSICS

Atom probe trajectory mapping using experimental tip shape measurements

(2011) D. HALEY et al.   JOURNAL OF MICROSCOPY

Transmission EBSD from 10 nm domains in a scanning electron microscope

(2011) R.R. KELLER et al.   JOURNAL OF MICROSCOPY

Characterizing Atomic Composition and Dopant Distribution in Wide Band Gap Semiconductor Nanowires Using Laser-Assisted Atom Probe Tomography

(2011) Ravi Agrawal et al.   Journal of Physical Chemistry C

New Equipment for Correlative FIB/TEM/Atom Probe and Site-Specific Preparation Using STEM Live Imaging

(2011) P Felfer et al.   MICROSCOPY AND MICROANALYSIS

A reproducible method for damage-free site-specific preparation of atom probe tips from interfaces

(2011) Peter Johann Felfer et al.   MICROSCOPY RESEARCH AND TECHNIQUE

Atom-probe for FinFET dopant characterization

(2011) A.K. Kambham et al.   ULTRAMICROSCOPY

Characterization of Grain Boundaries in Cu(In,Ga)Se$_{\bf 2}$ Films Using Atom-Probe Tomography

(2011) Oana Cojocaru-Mirédin et al.   IEEE Journal of Photovoltaics

Manganese diffusion in annealed magnetic tunnel junctions with MgO tunnel barriers

(2010) D.J. Larson et al.   SCRIPTA MATERIALIA

Atom probe analysis of a 3D finFET with high-k metal gate

(2010) M. Gilbert et al.   ULTRAMICROSCOPY

Shaping the lens of the atom probe: Fabrication of site specific, oriented specimens and application to grain boundary analysis

(2010) P. Felfer et al.   ULTRAMICROSCOPY

Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomography

(2010) D.J. Larson et al.   ULTRAMICROSCOPY

Correlation between TEM Imaging and Microanalysis for Atom Probe Reconstruction Verification

(2009) G Thompson et al.   MICROSCOPY AND MICROANALYSIS

Site-specific atomic scale analysis of solute segregation to a coincidence site lattice grain boundary

(2009) Mitra L. Taheri et al.   ULTRAMICROSCOPY

Growth of Si nanowires on micropillars for the study of their dopant distribution by atom probe tomography

(2008) T. Xu et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

Specimen Preparation for Cross-Section Atom Probe Analysis

(2008) D Lawrence et al.   MICROSCOPY AND MICROANALYSIS

Towards better 3-D reconstructions by combining electron tomography and atom-probe tomography

(2008) Ilke Arslan et al.   ULTRAMICROSCOPY

3-D analysis of semiconductor dopant distributions in a patterned structure using LEAP

(2007) J.S. Moore et al.   ULTRAMICROSCOPY