Grain boundary study of technically pure molybdenum by combining APT and TKD

Published 2015 View Full Article

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Title
Grain boundary study of technically pure molybdenum by combining APT and TKD
Authors
Keywords
Focused ion beam (FIB), Grain boundary segregation, Transmission-electron backscatter diffraction (t-EBSD), Transmission Kikuchi diffraction (TKD), Atom probe tomography (APT), Field ion microscopy (FIM)
Journal
ULTRAMICROSCOPY
Volume 159, Issue -, Pages 445-451
Publisher
Elsevier BV
Online
2015-05-21
DOI
10.1016/j.ultramic.2015.05.014

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