Methodology exploration of specimen preparation for atom probe tomography from nanowires

Published 2015 View Full Article

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Title
Methodology exploration of specimen preparation for atom probe tomography from nanowires
Authors
Keywords
Specimen preparation, Nanowires, Atom Probe Tomography, Focus Ion Beam
Journal
ULTRAMICROSCOPY
Volume 159, Issue -, Pages 427-431
Publisher
Elsevier BV
Online
2015-06-18
DOI
10.1016/j.ultramic.2015.06.003

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