New approaches to nanoparticle sample fabrication for atom probe tomography

Published 2015 View Full Article

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Title
New approaches to nanoparticle sample fabrication for atom probe tomography
Authors
Keywords
Atom probe tomography, Nanoparticles, Sample preparation, Focussed ion beam
Journal
ULTRAMICROSCOPY
Volume 159, Issue -, Pages 413-419
Publisher
Elsevier BV
Online
2015-05-03
DOI
10.1016/j.ultramic.2015.04.014

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