Correlation between TEM Imaging and Microanalysis for Atom Probe Reconstruction Verification

Title
Correlation between TEM Imaging and Microanalysis for Atom Probe Reconstruction Verification
Authors
Keywords
-
Journal
MICROSCOPY AND MICROANALYSIS
Volume 15, Issue S2, Pages 250-251
Publisher
Cambridge University Press (CUP)
Online
2009-07-27
DOI
10.1017/s1431927609099310

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