Characterization of Grain Boundaries in Cu(In,Ga)Se$_{\bf 2}$ Films Using Atom-Probe Tomography

Published 2011 View Full Article

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Title
Characterization of Grain Boundaries in Cu(In,Ga)Se$_{\bf 2}$ Films Using Atom-Probe Tomography
Authors
Keywords
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Journal
IEEE Journal of Photovoltaics
Volume 1, Issue 2, Pages 207-212
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-11-02
DOI
10.1109/jphotov.2011.2170447

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