Plasma-enhanced and thermal atomic layer deposition of Al2O3using dimethylaluminum isopropoxide, [Al(CH3)2(μ-OiPr)]2, as an alternative aluminum precursor
Published 2012 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Plasma-enhanced and thermal atomic layer deposition of Al2O3using dimethylaluminum isopropoxide, [Al(CH3)2(μ-OiPr)]2, as an alternative aluminum precursor
Authors
Keywords
-
Journal
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
Volume 30, Issue 2, Pages 021505
Publisher
American Vacuum Society
Online
2012-02-18
DOI
10.1116/1.3683057
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Low-temperature atomic layer deposition of Al2O3 thin coatings for corrosion protection of steel: Surface and electrochemical analysis
- (2011) Belén Díaz et al. CORROSION SCIENCE
- The study of thermal silicon dioxide electrets formed by corona discharge and rapid-thermal annealing
- (2011) Teng C. Kho et al. JOURNAL OF APPLIED PHYSICS
- Ultra-Thin Aluminium Oxide Films Deposited by Plasma-Enhanced Atomic Layer Deposition for Corrosion Protection
- (2011) S. E. Potts et al. JOURNAL OF THE ELECTROCHEMICAL SOCIETY
- Impact of parasitic reactions on wafer-scale uniformity in water-based and ozone-based atomic layer deposition
- (2011) Laurent Henn-Lecordier et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
- Plasma-Assisted Atomic Layer Deposition: Basics, Opportunities, and Challenges
- (2011) H. B. Profijt et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
- High-Speed Spatial Atomic-Layer Deposition of Aluminum Oxide Layers for Solar Cell Passivation
- (2010) Paul Poodt et al. ADVANCED MATERIALS
- Influence of the Oxidant on the Chemical and Field-Effect Passivation of Si by ALD Al[sub 2]O[sub 3]
- (2010) G. Dingemans et al. ELECTROCHEMICAL AND SOLID STATE LETTERS
- Low Temperature Plasma-Enhanced Atomic Layer Deposition of Metal Oxide Thin Films
- (2010) S. E. Potts et al. JOURNAL OF THE ELECTROCHEMICAL SOCIETY
- Dependence of the Decomposition of Trimethylaluminum on Oxygen Concentration
- (2010) Satoru Yamashita et al. JOURNAL OF THE ELECTROCHEMICAL SOCIETY
- Surface Reaction Mechanisms during Ozone and Oxygen Plasma Assisted Atomic Layer Deposition of Aluminum Oxide
- (2010) Vikrant R. Rai et al. LANGMUIR
- Low voltage organic devices and circuits with aluminum oxide thin film dielectric layer
- (2010) LiWei Shang et al. Science China-Technological Sciences
- Very low surface recombination velocity on p-type c-Si by high-rate plasma-deposited aluminum oxide
- (2009) Pierre Saint-Cast et al. APPLIED PHYSICS LETTERS
- Surface Reaction Mechanisms during Plasma-Assisted Atomic Layer Deposition of Titanium Dioxide
- (2009) Vikrant R. Rai et al. Journal of Physical Chemistry C
- In situspectroscopic ellipsometry as a versatile tool for studying atomic layer deposition
- (2009) E Langereis et al. JOURNAL OF PHYSICS D-APPLIED PHYSICS
- Physical and electrical characterizations of metal-oxide-semiconductor capacitors fabricated on GaAs substrates with different surface chemical treatments and Al[sub 2]O[sub 3] gate dielectric
- (2009) Domingo I. Garcia-Gutierrez et al. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
- Effective surface passivation of crystalline silicon by rf sputtered aluminum oxide
- (2009) Tsu-Tsung Li et al. Physica Status Solidi-Rapid Research Letters
- Silicon surface passivation by ultrathin Al2O3films synthesized by thermal and plasma atomic layer deposition
- (2009) G. Dingemans et al. Physica Status Solidi-Rapid Research Letters
- Detection of a Formate Surface Intermediate in the Atomic Layer Deposition of High-κ Dielectrics Using Ozone
- (2008) Jinhee Kwon et al. CHEMISTRY OF MATERIALS
- Silicon surface passivation by atomic layer deposited Al2O3
- (2008) B. Hoex et al. JOURNAL OF APPLIED PHYSICS
- Reaction mechanisms during plasma-assisted atomic layer deposition of metal oxides: A case study for Al2O3
- (2008) S. B. S. Heil et al. JOURNAL OF APPLIED PHYSICS
- On the c-Si surface passivation mechanism by the negative-charge-dielectric Al2O3
- (2008) B. Hoex et al. JOURNAL OF APPLIED PHYSICS
- Novel mixed alkylamido-cyclopentadienyl precursors for ALD of ZrO2 thin films
- (2008) Jaakko Niinistö et al. JOURNAL OF MATERIALS CHEMISTRY
- Surface Reaction Mechanisms during Ozone-Based Atomic Layer Deposition of Titanium Dioxide
- (2008) Vikrant R. Rai et al. Journal of Physical Chemistry C
- Al2O3 Atomic Layer Deposition with Trimethylaluminum and Ozone Studied by in Situ Transmission FTIR Spectroscopy and Quadrupole Mass Spectrometry
- (2008) David N. Goldstein et al. Journal of Physical Chemistry C
- Surface passivation of high-efficiency silicon solar cells by atomic-layer-deposited Al2O3
- (2008) J. Schmidt et al. PROGRESS IN PHOTOVOLTAICS
Publish scientific posters with Peeref
Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.
Learn MoreBecome a Peeref-certified reviewer
The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.
Get Started