Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors

Bias-Stress-Stable Solution-Processed Oxide Thin Film Transistors

(2010) Youngmin Jeong et al.   ACS Applied Materials & Interfaces

Fast Flexible Plastic Substrate ZnO Circuits

(2010) Dalong Zhao et al.   IEEE ELECTRON DEVICE LETTERS

Atomic Layer Deposition ZnO:N Thin Film Transistor: The Effects of N Concentration on the Device Properties

(2010) S. J. Lim et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Directed integration of ZnO nanobridge sensors using photolithographically patterned carbonized photoresist

(2010) Chien-Chih Huang et al.   NANOTECHNOLOGY

Impact of device configuration on the temperature instability of Al–Zn–Sn–O thin film transistors

(2009) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Mapping out the distribution of electronic states in the mobility gap of amorphous zinc tin oxide

(2009) Peter T. Erslev et al.   APPLIED PHYSICS LETTERS

The influence of the gate dielectrics on threshold voltage instability in amorphous indium-gallium-zinc oxide thin film transistors

(2009) Jaeseob Lee et al.   APPLIED PHYSICS LETTERS

Origins of threshold voltage shifts in room-temperature deposited and annealed a-In–Ga–Zn–O thin-film transistors

(2009) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Gate-bias stress in amorphous oxide semiconductors thin-film transistors

(2009) M. E. Lopes et al.   APPLIED PHYSICS LETTERS

The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors

(2009) Kwang-Hee Lee et al.   APPLIED PHYSICS LETTERS

Comparative study of electrical instabilities in top-gate InGaZnO thin film transistors with Al2O3 and Al2O3/SiNx gate dielectrics

(2009) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS

Environment-dependent metastability of passivation-free indium zinc oxide thin film transistor after gate bias stress

(2009) Po-Tsun Liu et al.   APPLIED PHYSICS LETTERS

Competitive surface effects of oxygen and water on UV photoresponse of ZnO nanowires

(2009) Yanbo Li et al.   APPLIED PHYSICS LETTERS

Reliable Bottom Gate Amorphous Indium–Gallium–Zinc Oxide Thin-Film Transistors with TiO[sub x] Passivation Layer

(2009) Hyun-Sik Seo et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

High Performance Solution-Processed and Lithographically Patterned Zinc–Tin Oxide Thin-Film Transistors with Good Operational Stability

(2009) Sung Kyu Park et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors

(2009) Jae-Heon Shin et al.   ETRI JOURNAL

Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors

(2009) Ken Hoshino et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Fast PEALD ZnO Thin-Film Transistor Circuits

(2009) Devin A. Mourey et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

High mobility amorphous zinc oxynitride semiconductor material for thin film transistors

(2009) Yan Ye et al.   JOURNAL OF APPLIED PHYSICS

Electrical Instability of RF Sputter Amorphous In-Ga-Zn-O Thin-Film Transistors

(2009) Tze-Ching Fung et al.   Journal of Display Technology

Oxide Electronics by Spatial Atomic Layer Deposition

(2009) David H. Levy et al.   Journal of Display Technology

Transparent Electronics for See-Through AMOLED Displays

(2009) Thomas Riedl et al.   Journal of Display Technology

Encapsulation of Zinc Tin Oxide Based Thin Film Transistors

(2009) Patrick Görrn et al.   Journal of Physical Chemistry C

High performance solution-processed amorphous zinc tin oxide thin film transistor

(2009) Seok-Jun Seo et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Performance and Stability of Low Temperature Transparent Thin-Film Transistors Using Amorphous Multicomponent Dielectrics

(2009) P. Barquinha et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Stability of thin film transistors incorporating a zinc oxide or indium zinc oxide channel deposited by a high rate sputtering process

(2009) A J Flewitt et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Zinc tin oxide based driver for highly transparent active matrix OLED displays

(2009) Patrick Görrn et al.   SOLID-STATE ELECTRONICS

Stability of indium-oxide thin-film transistors by reactive ion beam assisted deposition

(2009) Y. Vygranenko et al.   THIN SOLID FILMS

Surface-induced time-dependent instability of ZnO based thin-film transistors

(2009) Ki-tae Kim et al.   THIN SOLID FILMS

Amorphous In–Ga–Zn-O thin-film transistor with coplanar homojunction structure

(2009) Ayumu Sato et al.   THIN SOLID FILMS

Subgap states in transparent amorphous oxide semiconductor, In–Ga–Zn–O, observed by bulk sensitive x-ray photoelectron spectroscopy

(2008) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Modeling of amorphous InGaZnO4 thin film transistors and their subgap density of states

(2008) Hsing-Hung Hsieh et al.   APPLIED PHYSICS LETTERS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Trap densities in amorphous-InGaZnO4 thin-film transistors

(2008) Mutsumi Kimura et al.   APPLIED PHYSICS LETTERS

Transparent Al–Zn–Sn–O thin film transistors prepared at low temperature

(2008) Doo-Hee Cho et al.   APPLIED PHYSICS LETTERS

Electronic transport properties of amorphous indium-gallium-zinc oxide semiconductor upon exposure to water

(2008) Jin-Seong Park et al.   APPLIED PHYSICS LETTERS

Stable ZnO thin film transistors by fast open air atomic layer deposition

(2008) David H. Levy et al.   APPLIED PHYSICS LETTERS

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

(2008) A. Suresh et al.   APPLIED PHYSICS LETTERS

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

(2008) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS

The Effect of Gate-Bias Stress and Temperature on the Performance of ZnO Thin-Film Transistors

(2008) R.B.M. Cross et al.   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Thermal Analysis of Degradation in Ga2O3–In2O3–ZnO Thin-Film Transistors

(2008) Mami Fujii et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Processing effects on the stability of amorphous indium gallium zinc oxide thin-film transistors

(2008) Hai Q. Chiang et al.   JOURNAL OF NON-CRYSTALLINE SOLIDS

Physics of amorphous conducting oxides

(2008) John Robertson   JOURNAL OF NON-CRYSTALLINE SOLIDS

Improving the Gate Stability of ZnO Thin-Film Transistors with Aluminum Oxide Dielectric Layers

(2008) Min Suk Oh et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Stable room temperature deposited amorphous InGaZnO[sub 4] thin film transistors

(2008) Wantae Lim et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

ZnO nanowire field-effect transistor as a UV photodetector; optimization for maximum sensitivity

(2008) Woong Kim et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses

(2008) In-Tak Cho et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Disorder, band offsets and dopability of transparent conducting oxides

(2007) John Robertson   THIN SOLID FILMS

Amorphous IZO-based transparent thin film transistors

(2007) David C. Paine et al.   THIN SOLID FILMS