Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses

标题
Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses
作者
关键词
-
出版物
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 24, Issue 1, Pages 015013
出版商
IOP Publishing
发表日期
2008-12-13
DOI
10.1088/0268-1242/24/1/015013

向作者/读者发起求助以获取更多资源

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started