Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

Trap densities in amorphous-InGaZnO4 thin-film transistors

(2008) Mutsumi Kimura et al.   APPLIED PHYSICS LETTERS

Charge trapping induced current instability in pentacene thin film transistors: Trapping barrier and effect of surface treatment

(2008) T. Miyadera et al.   APPLIED PHYSICS LETTERS

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

(2008) A. Suresh et al.   APPLIED PHYSICS LETTERS

Short Channel Characteristics of Gallium–Indium–Zinc–Oxide Thin Film Transistors for Three-Dimensional Stacking Memory

(2008) Ihun Song et al.   IEEE ELECTRON DEVICE LETTERS

Gallium–Indium–Zinc-Oxide-Based Thin-Film Transistors: Influence of the Source/Drain Material

(2008) Pedro Barquinha et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Crystallization of amorphous indium zinc oxide thin films produced by radio-frequency magnetron sputtering

(2007) G. Gonçalves et al.   THIN SOLID FILMS

Amorphous IZO-based transparent thin film transistors

(2007) David C. Paine et al.   THIN SOLID FILMS