Environment-dependent metastability of passivation-free indium zinc oxide thin film transistor after gate bias stress

标题
Environment-dependent metastability of passivation-free indium zinc oxide thin film transistor after gate bias stress
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 95, Issue 23, Pages 233504
出版商
AIP Publishing
发表日期
2009-12-09
DOI
10.1063/1.3272016

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