Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

标题
Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 92, Issue 3, Pages 033502
出版商
AIP Publishing
发表日期
2008-01-24
DOI
10.1063/1.2824758

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