4.2 Article

Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors

期刊

ETRI JOURNAL
卷 31, 期 1, 页码 62-64

出版社

WILEY
DOI: 10.4218/etrij.09.0208.0266

关键词

ZnO; transparent oxide semiconductor; thin film transistor (TFT); bias stability; light effect

资金

  1. MKE [2006-S079-02]

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We report on the bias stability characteristics of transparent ZnO thin film transistors (TFTs) under visible light illumination. The transfer curve shows virtually no change under positive gate bias stress with light illumination, while it shows dramatic negative shy under negative gate bias stress. The major mechanism of the bias stability under visible illumination of our ZnO The is thought to be the charge trapping of photo-generated holes at the gate insulator and/or insulator/channel interface.

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