Resistive Switching by Voltage-Driven Ion Migration in Bipolar RRAM—Part I: Experimental Study
Published 2012 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Resistive Switching by Voltage-Driven Ion Migration in Bipolar RRAM—Part I: Experimental Study
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 59, Issue 9, Pages 2461-2467
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-08-14
DOI
10.1109/ted.2012.2202319
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Resistive Switching by Voltage-Driven Ion Migration in Bipolar RRAM—Part II: Modeling
- (2012) Stefano Larentis et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Origin of the Ultra-nonlinear Switching Kinetics in Oxide-Based Resistive Switches
- (2011) Stephan Menzel et al. ADVANCED FUNCTIONAL MATERIALS
- Investigating the switching dynamics and multilevel capability of bipolar metal oxide resistive switching memory
- (2011) Shimeng Yu et al. APPLIED PHYSICS LETTERS
- Reset Instability in Pulsed-Operated Unipolar Resistive-Switching Random Access Memory Devices
- (2011) Federico Nardi et al. IEEE ELECTRON DEVICE LETTERS
- Linear Scaling of Reset Current Down to 22-nm Node for a Novel $\hbox{Cu}_{x}\hbox{Si}_{y}\hbox{O}$ RRAM
- (2011) L. M. Yang et al. IEEE ELECTRON DEVICE LETTERS
- Modeling the Universal Set/Reset Characteristics of Bipolar RRAM by Field- and Temperature-Driven Filament Growth
- (2011) Daniele Ielmini IEEE TRANSACTIONS ON ELECTRON DEVICES
- Universal Reset Characteristics of Unipolar and Bipolar Metal-Oxide RRAM
- (2011) Daniele Ielmini et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Scaling analysis of submicrometer nickel-oxide-based resistive switching memory devices
- (2011) D. Ielmini et al. JOURNAL OF APPLIED PHYSICS
- Metal oxide resistive memory switching mechanism based on conductive filament properties
- (2011) G. Bersuker et al. JOURNAL OF APPLIED PHYSICS
- Resistive switching characteristics of ultra-thin TiOx
- (2011) Jubong Park et al. MICROELECTRONIC ENGINEERING
- Physical models of size-dependent nanofilament formation and rupture in NiO resistive switching memories
- (2011) D Ielmini et al. NANOTECHNOLOGY
- A fast, high-endurance and scalable non-volatile memory device made from asymmetric Ta2O5−x/TaO2−x bilayer structures
- (2011) Myoung-Jae Lee et al. NATURE MATERIALS
- Thermochemical resistive switching: materials, mechanisms, and scaling projections
- (2011) Daniele Ielmini et al. PHASE TRANSITIONS
- High switching endurance in TaOx memristive devices
- (2010) J. Joshua Yang et al. APPLIED PHYSICS LETTERS
- Unipolar $\hbox{TaO}_{x}$-Based Resistive Change Memory Realized With Electrode Engineering
- (2010) Lijie Zhang et al. IEEE ELECTRON DEVICE LETTERS
- Atomic structure of conducting nanofilaments in TiO2 resistive switching memory
- (2010) Deok-Hwang Kwon et al. Nature Nanotechnology
- Model of metallic filament formation and rupture in NiO for unipolar switching
- (2010) Hyung Dong Lee et al. PHYSICAL REVIEW B
- Control of filament size and reduction of reset current below 10μA in NiO resistance switching memories
- (2010) F. Nardi et al. SOLID-STATE ELECTRONICS
- Redox-Based Resistive Switching Memories - Nanoionic Mechanisms, Prospects, and Challenges
- (2009) Rainer Waser et al. ADVANCED MATERIALS
- The conical shape filament growth model in unipolar resistance switching of TiO2 thin film
- (2009) Kyung Min Kim et al. APPLIED PHYSICS LETTERS
- Optimized Ni Oxidation in 80-nm Contact Holes for Integration of Forming-Free and Low-Power Ni/NiO/Ni Memory Cells
- (2009) Ludovic Goux et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Reduction in the reset current in a resistive random access memory consisting of NiOx brought about by reducing a parasitic capacitance
- (2008) K. Kinoshita et al. APPLIED PHYSICS LETTERS
Discover Peeref hubs
Discuss science. Find collaborators. Network.
Join a conversationBecome a Peeref-certified reviewer
The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.
Get Started