Resistive Switching by Voltage-Driven Ion Migration in Bipolar RRAM—Part I: Experimental Study

Title
Resistive Switching by Voltage-Driven Ion Migration in Bipolar RRAM—Part I: Experimental Study
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 59, Issue 9, Pages 2461-2467
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-08-14
DOI
10.1109/ted.2012.2202319

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