Stability study of solution-processed zinc tin oxide thin-film transistors
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Title
Stability study of solution-processed zinc tin oxide thin-film transistors
Authors
Keywords
thin-film transistor, oxide semiconductor, solution process, reliability
Journal
Electronic Materials Letters
Volume 11, Issue 6, Pages 964-972
Publisher
Springer Nature
Online
2015-10-28
DOI
10.1007/s13391-015-5209-4
References
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