Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With $\hbox{SiN}_{x}$ and $ \hbox{SiO}_{2}$ Gate Dielectrics

The Impact of Device Configuration on the Photon-Enhanced Negative Bias Thermal Instability of GaInZnO Thin Film Transistors

(2010) Jang-Yeon Kwon et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

High-Performance a-IGZO TFT With $\hbox{ZrO}_{2}$ Gate Dielectric Fabricated at Room Temperature

(2010) Jae Sang Lee et al.   IEEE ELECTRON DEVICE LETTERS

The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors

(2009) Kwang-Hee Lee et al.   APPLIED PHYSICS LETTERS

Low-voltage InGaZnO thin-film transistors with Al2O3 gate insulator grown by atomic layer deposition

(2009) J. B. Kim et al.   APPLIED PHYSICS LETTERS

Electronic structure of amorphous InGaO3(ZnO)0.5 thin films

(2009) Deok-Yong Cho et al.   THIN SOLID FILMS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Comprehensive Study on the Transport Mechanism of Amorphous Indium-Gallium-Zinc Oxide Transistors

(2008) Jae Kyeong Jeong et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY