Photo stability of solution-processed low-voltage high mobility zinc-tin-oxide/ZrO2 thin-film transistors for transparent display applications

Electrical instability of amorphous indium-gallium-zinc oxide thin film transistors under monochromatic light illumination

(2012) Xiaoming Huang et al.   APPLIED PHYSICS LETTERS

Localized tail state distribution in amorphous oxide transistors deduced from low temperature measurements

(2012) Sungsik Lee et al.   APPLIED PHYSICS LETTERS

Anomalous behavior of negative bias illumination stress instability in an indium zinc oxide transistor: A cation combinatorial approach

(2012) Seungha Oh et al.   APPLIED PHYSICS LETTERS

The Effect of the Photo-Induced Carriers on the Reliability of Oxide TFTs Under Various Intensities of Light

(2012) Soo-Yeon Lee et al.   IEEE ELECTRON DEVICE LETTERS

Solution-Processed High-k Dielectric, ZrO2, and Integration in Thin-Film Transistors

(2012) Chen-Guan Lee et al.   JOURNAL OF ELECTRONIC MATERIALS

Improvement of the photo-bias stability of the Zn–Sn–O field effect transistors by an ozone treatment

(2012) Bong Seob Yang et al.   JOURNAL OF MATERIALS CHEMISTRY

Improved negative bias illumination instability of sol-gel gallium zinc tin oxide thin film transistors

(2011) Seok-Jun Seo et al.   APPLIED PHYSICS LETTERS

Correlation of photoconductivity response of amorphous In–Ga–Zn–O films with transistor performance using microwave photoconductivity decay method

(2011) Satoshi Yasuno et al.   APPLIED PHYSICS LETTERS

Light Effect on Negative Bias-Induced Instability of HfInZnO Amorphous Oxide Thin-Film Transistor

(2011) Dae Woong Kwon et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Electrical-Stress-Induced Threshold Voltage Instability in Solution-Processed ZnO Thin-Film Transistors: An Experimental and Simulation Study

(2011) Dipti Gupta et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Bias-Stress-Stable Solution-Processed Oxide Thin Film Transistors

(2010) Youngmin Jeong et al.   ACS Applied Materials & Interfaces

O-vacancy as the origin of negative bias illumination stress instability in amorphous In–Ga–Zn–O thin film transistors

(2010) Byungki Ryu et al.   APPLIED PHYSICS LETTERS

Solution-processed zinc–tin oxide thin-film transistors with low interfacial trap density and improved performance

(2010) Chen-Guan Lee et al.   APPLIED PHYSICS LETTERS

Effect of Zr addition on ZnSnO thin-film transistors using a solution process

(2010) You Seung Rim et al.   APPLIED PHYSICS LETTERS

The impact of gate dielectric materials on the light-induced bias instability in Hf–In–Zn–O thin film transistor

(2010) Jang-Yeon Kwon et al.   APPLIED PHYSICS LETTERS

Band transport and mobility edge in amorphous solution-processed zinc tin oxide thin-film transistors

(2010) Chen-Guan Lee et al.   APPLIED PHYSICS LETTERS

Flexible Low-Voltage Organic Thin-Film Transistors Enabled by Low-Temperature, Ambient Solution-Processable Inorganic/Organic Hybrid Gate Dielectrics

(2010) Young-geun Ha et al.   JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

Encapsulation of Zinc Tin Oxide Based Thin Film Transistors

(2009) Patrick Görrn et al.   Journal of Physical Chemistry C