Double-layer channel structure based ZnO thin-film transistor grown by atomic layer deposition

High-Performance Nanowire Oxide Photo-Thin Film Transistor

(2013) Seung-Eon Ahn et al.   ADVANCED MATERIALS

Enhancement of Electrical Stability in Oxide Thin-Film Transistors Using Multilayer Channels Grown by Atomic Layer Deposition

(2013) Cheol Hyoun Ahn et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Tunable Electrical and Optical Properties in Composition Controlled Hf:ZnO Thin Films Grown by Atomic Layer Deposition

(2012) Cheol Hyoun Ahn et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Improvement in both mobility and bias stability of ZnSnO transistors by inserting ultra-thin InSnO layer at the gate insulator/channel interface

(2011) Ji-In Kim et al.   APPLIED PHYSICS LETTERS

Time-temperature dependence of positive gate bias stress and recovery in amorphous indium-gallium-zinc-oxide thin-film-transistors

(2011) Md Delwar Hossain Chowdhury et al.   APPLIED PHYSICS LETTERS

Highly Stable Transparent Amorphous Oxide Semiconductor Thin-Film Transistors Having Double-Stacked Active Layers

(2010) Jae Chul Park et al.   ADVANCED MATERIALS

Photon-accelerated negative bias instability involving subgap states creation in amorphous In–Ga–Zn–O thin film transistor

(2010) Himchan Oh et al.   APPLIED PHYSICS LETTERS

Improved Electrical Stability in the Al Doped ZnO Thin-Film-Transistors Grown by Atomic Layer Deposition

(2010) Cheol Hyoun Ahn et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Deposition of Al doped ZnO layers with various electrical types by atomic layer deposition

(2010) Cheol Hyoun Ahn et al.   THIN SOLID FILMS

Gate-bias stress in amorphous oxide semiconductors thin-film transistors

(2009) M. E. Lopes et al.   APPLIED PHYSICS LETTERS

Transparent and Photo-stable ZnO Thin-film Transistors to Drive an Active Matrix Organic-Light- Emitting-Diode Display Panel

(2008) Sang-Hee K. Park et al.   ADVANCED MATERIALS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Electronic transport properties of amorphous indium-gallium-zinc oxide semiconductor upon exposure to water

(2008) Jin-Seong Park et al.   APPLIED PHYSICS LETTERS

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

(2008) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS