Bias-Stress-Stable Solution-Processed Oxide Thin Film Transistors

Published 2010 View Full Article

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Title
Bias-Stress-Stable Solution-Processed Oxide Thin Film Transistors
Authors
Keywords
-
Journal
ACS Applied Materials & Interfaces
Volume 2, Issue 3, Pages 611-615
Publisher
American Chemical Society (ACS)
Online
2010-02-26
DOI
10.1021/am900787k

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