Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods

An oversampling method for wafer map defect pattern classification considering small and imbalanced data

(2021) Eun-Su Kim et al.   COMPUTERS & INDUSTRIAL ENGINEERING

Wafer map defect recognition based on deep transfer learning-based densely connected convolutional network and deep forest

(2021) Jianbo Yu et al.   ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE

Active Learning of Convolutional Neural Network for Cost-Effective Wafer Map Pattern Classification

(2020) Jaewoong Shim et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

A Voting Ensemble Classifier for Wafer Map Defect Patterns Identification in Semiconductor Manufacturing

(2019) Muhammad Saqlain et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Bin2Vec: A Better Wafer Bin Map Coloring Scheme for Comprehensible Visualization and Effective Bad Wafer Classification

(2019) Junhong Kim et al.   Applied Sciences-Basel

Classification of mixed-type defect patterns in wafer bin maps using convolutional neural networks

(2018) Kiryong Kyeong et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network

(2018) Takeshi Nakazawa et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Decision Tree Ensemble-Based Wafer Map Failure Pattern Recognition Based on Radon Transform-Based Features

(2018) Minghao Piao et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

A Comprehensive Big-Data-Based Monitoring System for Yield Enhancement in Semiconductor Manufacturing

(2017) Kouta Nakata et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Wafer Map Defect Detection and Recognition Using Joint Local and Nonlocal Linear Discriminant Analysis

(2016) Jianbo Yu et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps

(2015) Fatima Adly et al.   IEEE Transactions on Industrial Informatics

Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets

(2015) Ming-Ju Wu et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligence

(2013) Chen-Fu Chien et al.   INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH

An intelligent system for wafer bin map defect diagnosis: An empirical study for semiconductor manufacturing

(2012) Chiao-Wen Liu et al.   ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE

Detection of Spatial Defect Patterns Generated in Semiconductor Fabrication Processes

(2011) Tao Yuan et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Multi-step ART1 algorithm for recognition of defect patterns on semiconductor wafers

(2011) Gyunghyun Choi et al.   INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH

Statistical Detection of Defect Patterns Using Hough Transform

(2010) Qiang Zhou et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Separation of composite defect patterns on wafer bin map using support vector clustering

(2008) Chih-Hsuan Wang   EXPERT SYSTEMS WITH APPLICATIONS

Defect spatial pattern recognition using a hybrid SOM–SVM approach in semiconductor manufacturing

(2007) Te-Sheng Li et al.   EXPERT SYSTEMS WITH APPLICATIONS