Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps

Published 2015 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps
Authors
Keywords
-
Journal
IEEE Transactions on Industrial Informatics
Volume 11, Issue 6, Pages 1267-1276
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2015-09-25
DOI
10.1109/tii.2015.2481719

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.