Bin2Vec: A Better Wafer Bin Map Coloring Scheme for Comprehensible Visualization and Effective Bad Wafer Classification

Clustering the Dominant Defective Patterns in Semiconductor Wafer Maps

(2018) Kamal Taha et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Dendritic Neuron Model With Effective Learning Algorithms for Classification, Approximation, and Prediction

(2018) Shangce Gao et al.   IEEE Transactions on Neural Networks and Learning Systems

Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps

(2015) Fatima Adly et al.   IEEE Transactions on Industrial Informatics

Randomized General Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps

(2015) Fatima Adly et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets

(2015) Ming-Ju Wu et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Similarity Searching for Defective Wafer Bin Maps in Semiconductor Manufacturing

(2013) Chung-Shou Liao et al.   IEEE Transactions on Automation Science and Engineering

An intelligent system for wafer bin map defect diagnosis: An empirical study for semiconductor manufacturing

(2012) Chiao-Wen Liu et al.   ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE

Development Pattern Recognition Model for the Classification of Circuit Probe Wafer Maps on Semiconductors

(2012) Cheng-Wei Chang et al.   IEEE Transactions on Components Packaging and Manufacturing Technology

Separation of composite defect patterns on wafer bin map using support vector clustering

(2008) Chih-Hsuan Wang   EXPERT SYSTEMS WITH APPLICATIONS

Defect spatial pattern recognition using a hybrid SOM–SVM approach in semiconductor manufacturing

(2007) Te-Sheng Li et al.   EXPERT SYSTEMS WITH APPLICATIONS