Wafer map defect recognition based on deep transfer learning-based densely connected convolutional network and deep forest

Wafer map defect pattern classification based on convolutional neural network features and error-correcting output codes

(2020) Cheng Hao Jin et al.   JOURNAL OF INTELLIGENT MANUFACTURING

Joint Feature and Label Adversarial Network for Wafer Map Defect Recognition

(2020) Jianbo Yu et al.   IEEE Transactions on Automation Science and Engineering

A Voting Ensemble Classifier for Wafer Map Defect Patterns Identification in Semiconductor Manufacturing

(2019) Muhammad Saqlain et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Implementing Deep Learning for comprehensive aircraft icing and actuator/sensor fault detection/identification

(2019) Yiqun Dong   ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE

Wafer Defect Pattern Recognition and Analysis Based on Convolutional Neural Network

(2019) Naigong Yu et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Wafer Map Defect Pattern Recognition Using Rotation-Invariant Features

(2019) Rui Wang et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

A deep Boltzmann machine and multi-grained scanning forest ensemble collaborative method and its application to industrial fault diagnosis

(2018) Guangzheng Hu et al.   COMPUTERS IN INDUSTRY

Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network

(2018) Takeshi Nakazawa et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Deep Forest-based Prediction of Protein Subcellular Localization

(2018) Lingling Zhao et al.   CURRENT GENE THERAPY

Spectrum of Variable-Random Trees

(2018) F. T. Liu et al.   JOURNAL OF ARTIFICIAL INTELLIGENCE RESEARCH

A Deep Learning Model for Robust Wafer Fault Monitoring With Sensor Measurement Noise

(2017) Hoyeop Lee et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Design of deep convolutional neural network architectures for automated feature extraction in industrial inspection

(2016) Daniel Weimer et al.   CIRP ANNALS-MANUFACTURING TECHNOLOGY

Step-Down Spatial Randomness Test for Detecting Abnormalities in DRAM Wafers with Multiple Spatial Maps

(2016) Byunghoon Kim et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Wafer Map Defect Detection and Recognition Using Joint Local and Nonlocal Linear Discriminant Analysis

(2016) Jianbo Yu et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps

(2015) Fatima Adly et al.   IEEE Transactions on Industrial Informatics

Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets

(2015) Ming-Ju Wu et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

A Regularized Singular Value Decomposition-Based Approach for Failure Pattern Classification on Fail Bit Map in a DRAM Wafer

(2015) Byunghoon Kim et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Deep learning

(2015) Yann LeCun et al.   NATURE

A novel defect detection and identification method in optical inspection

(2013) Liangjun Xie et al.   NEURAL COMPUTING & APPLICATIONS

An intelligent system for wafer bin map defect diagnosis: An empirical study for semiconductor manufacturing

(2012) Chiao-Wen Liu et al.   ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE

Defect cluster recognition system for fabricated semiconductor wafers

(2012) Melanie Po-Leen Ooi et al.   ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE

Wafer Classification Using Support Vector Machines

(2012) R. Baly et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index

(2009) Li-Chang Chao et al.   EXPERT SYSTEMS WITH APPLICATIONS

A Survey on Transfer Learning

(2009) Sinno Jialin Pan et al.   IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING