Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors

Contact resistance reduction of ZnO thin film transistors (TFTs) with saw-shaped electrode

(2018) Woojin Park et al.   NANOTECHNOLOGY

Effect of defect creation and migration on hump characteristics of a-InGaZnO thin film transistors under long-term drain bias stress with light illumination

(2018) Yong-Jung Cho et al.   SOLID-STATE ELECTRONICS

Low-temperature fabrication of an HfO2 passivation layer for amorphous indium–gallium–zinc oxide thin film transistors using a solution process

(2017) Seonghwan Hong et al.   Scientific Reports

~3-nm ZnO Nanoislands Deposition and Application in Charge Trapping Memory Grown by Single ALD Step

(2016) Nazek El-Atab et al.   Scientific Reports

Dual role of boron in improving electrical performance and device stability of low temperature solution processed ZnO thin film transistors

(2015) Srinivas Gandla et al.   APPLIED PHYSICS LETTERS

Interface Trap-Induced Nonideality in As-Deposited Ni/4H-SiC Schottky Barrier Diode

(2015) Sabih Uddin Omar et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Simple Method to Enhance Positive Bias Stress Stability of In–Ga–Zn–O Thin-Film Transistors Using a Vertically Graded Oxygen-Vacancy Active Layer

(2014) Ji Hoon Park et al.   ACS Applied Materials & Interfaces

Mechanism of positive bias stress-assisted recovery in amorphous-indium-gallium-zinc-oxide thin-film transistors from negative bias under illumination stress

(2013) Jae Gwang Um et al.   APPLIED PHYSICS LETTERS

Hot-Carrier Effect on Amorphous In-Ga-Zn-O Thin-Film Transistors With a Via-Contact Structure

(2013) Tien-Yu Hsieh et al.   IEEE ELECTRON DEVICE LETTERS

Electrical instability of amorphous indium-gallium-zinc oxide thin film transistors under monochromatic light illumination

(2012) Xiaoming Huang et al.   APPLIED PHYSICS LETTERS

Thermal Effect on the Gate-Drain Bias Stress for Amorphous InGaZnO Thin Film Transistors

(2012) Sheng-Yao Huang et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

ZnO Oxygen Vacancies Formation and Filling Followed by in Situ Photoluminescence and in Situ EPR

(2012) Charlotte Drouilly et al.   Journal of Physical Chemistry C

Characterization of environment-dependent hysteresis in indium gallium zinc oxide thin film transistors

(2012) Yu-Chun Chen et al.   SURFACE & COATINGS TECHNOLOGY

Implication of oxygen vacancies on current conduction mechanisms in TiN/Zr1−xAlxO2/TiN metal-insulator-metal structures

(2011) A. Paskaleva et al.   JOURNAL OF APPLIED PHYSICS

Analysis of Hump Characteristics in Thin-Film Transistors With ZnO Channels Deposited by Sputtering at Various Oxygen Partial Pressures

(2010) Mamoru Furuta et al.   IEEE ELECTRON DEVICE LETTERS

High performance thin film transistor with cosputtered amorphous Zn–In–Sn–O channel: Combinatorial approach

(2009) Min Ki Ryu et al.   APPLIED PHYSICS LETTERS

Flexible TFTs based on solution-processed ZnO nanoparticles

(2009) Jin Hyung Jun et al.   NANOTECHNOLOGY

Characteristics of the ZnO thin film transistor by atomic layer deposition at various temperatures

(2009) Semyung Kwon et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Electrically stable low voltage ZnO transistors with organic/inorganic nanohybrid dielectrics

(2008) Sung Hoon Cha et al.   APPLIED PHYSICS LETTERS

High field-effect mobility amorphous InGaZnO transistors with aluminum electrodes

(2008) Jong H. Na et al.   APPLIED PHYSICS LETTERS

Stable ZnO thin film transistors by fast open air atomic layer deposition

(2008) David H. Levy et al.   APPLIED PHYSICS LETTERS

Transparent electronics: Schottky barrier and heterojunction considerations

(2007) J.F. Wager   THIN SOLID FILMS