Thermal Effect on the Gate-Drain Bias Stress for Amorphous InGaZnO Thin Film Transistors
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Title
Thermal Effect on the Gate-Drain Bias Stress for Amorphous InGaZnO Thin Film Transistors
Authors
Keywords
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Journal
ELECTROCHEMICAL AND SOLID STATE LETTERS
Volume 15, Issue 5, Pages H161
Publisher
The Electrochemical Society
Online
2012-03-01
DOI
10.1149/2.019205esl
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