Interface Trap-Induced Nonideality in As-Deposited Ni/4H-SiC Schottky Barrier Diode

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Title
Interface Trap-Induced Nonideality in As-Deposited Ni/4H-SiC Schottky Barrier Diode
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 62, Issue 2, Pages 615-621
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-12-31
DOI
10.1109/ted.2014.2383386

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