Low-temperature fabrication of an HfO2 passivation layer for amorphous indium–gallium–zinc oxide thin film transistors using a solution process

Solution-Processed Amorphous In–Zn–Sn Oxide Thin-Film Transistor Performance Improvement by Solution-Processed Y2O3Passivation

(2016) Ravindra Naik Bukke et al.   IEEE ELECTRON DEVICE LETTERS

Reliability Improvement of Amorphous InGaZnO Thin-Film Transistors by Less Hydroxyl-Groups Siloxane Passivation

(2016) Chaiyanan Kulchaisit et al.   Journal of Display Technology

Electrical stability enhancement of GeInGaO thin-film transistors by solution-processed Li-doped yttrium oxide passivation

(2016) U H Choi et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Homojunction Solution-Processed Metal Oxide Thin-Film Transistors Using Passivation-Induced Channel Definition

(2014) Jung Hyun Kim et al.   ACS Applied Materials & Interfaces

Simple Method to Enhance Positive Bias Stress Stability of In–Ga–Zn–O Thin-Film Transistors Using a Vertically Graded Oxygen-Vacancy Active Layer

(2014) Ji Hoon Park et al.   ACS Applied Materials & Interfaces

Improvement of bias-stability in amorphous-indium-gallium-zinc-oxide thin-film transistors by using solution-processed Y2O3 passivation

(2014) Sungjin An et al.   APPLIED PHYSICS LETTERS

Improvements in passivation effect of amorphous InGaZnO thin film transistors

(2014) Chengyuan Dong et al.   MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

High performance In2O3 thin film transistors using chemically derived aluminum oxide dielectric

(2013) Pradipta K. Nayak et al.   APPLIED PHYSICS LETTERS

Effect of hafnium addition on Zn-Sn-O thin film transistors fabricated by solution process

(2012) Jun Young Choi et al.   APPLIED PHYSICS LETTERS

Solution-Processed Zinc Oxide Thin-Film Transistors With a Low-Temperature Polymer Passivation Layer

(2012) Xiaoli Xu et al.   IEEE ELECTRON DEVICE LETTERS

Solution processed hafnium oxide as a gate insulator for low-voltage oxide thin-film transistors

(2012) Christophe Avis et al.   JOURNAL OF MATERIALS CHEMISTRY

Effects of Sol-Gel Organic-Inorganic Hybrid Passivation on Stability of Solution-Processed Zinc Tin Oxide Thin Film Transistors

(2011) Seok-Jun Seo et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Fast and Stable Solution-Processed Transparent Oxide Thin-Film Transistor Circuits

(2011) Kwang Ho Kim et al.   IEEE ELECTRON DEVICE LETTERS

Influence of hydrogen annealing on the properties of hafnium oxide thin films

(2011) M.F. Al-Kuhaili et al.   MATERIALS CHEMISTRY AND PHYSICS

Influence of a highly doped buried layer for HfInZnO thin-film transistors

(2011) Eugene Chong et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Effect of hafnium addition on the electrical properties of indium zinc oxide thin film transistors

(2011) Dae-Ho Son et al.   THIN SOLID FILMS

Stability and high-frequency operation of amorphous In–Ga–Zn–O thin-film transistors with various passivation layers

(2011) Kenji Nomura et al.   THIN SOLID FILMS

Carrier-suppressing effect of scandium in InZnO systems for solution-processed thin film transistors

(2010) Yuri Choi et al.   APPLIED PHYSICS LETTERS

Investigating addition effect of hafnium in InZnO thin film transistors using a solution process

(2010) Woong Hee Jeong et al.   APPLIED PHYSICS LETTERS

High stability of amorphous hafnium-indium-zinc-oxide thin film transistor

(2010) Eugene Chong et al.   APPLIED PHYSICS LETTERS

Solvent-free solution processed passivation layer for improved long-term stability of organic field-effect transistors

(2010) Sooji Nam et al.   JOURNAL OF MATERIALS CHEMISTRY

Amorphous hafnium-indium-zinc oxide semiconductor thin film transistors

(2009) Chang-Jung Kim et al.   APPLIED PHYSICS LETTERS

High Performance Solution-Processed and Lithographically Patterned Zinc–Tin Oxide Thin-Film Transistors with Good Operational Stability

(2009) Sung Kyu Park et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Pentacene-Based Thin-Film Transistors With a Solution-Process Hafnium Oxide Insulator

(2009) Chia-Yu Wei et al.   IEEE ELECTRON DEVICE LETTERS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Amorphous oxide channel TFTs

(2007) Hideya Kumomi et al.   THIN SOLID FILMS