MICROELECTRONICS RELIABILITY

Journal Title

MICROELECTRONICS RELIABILITY

MICROELECTRON RELIAB

ISSN / eISSN

0026-2714

Aims and Scope

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.

Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.

Subject Area

ENGINEERING, ELECTRICAL & ELECTRONIC

NANOSCIENCE & NANOTECHNOLOGY

PHYSICS, APPLIED

CiteScore

2.80 View Trend

CiteScore Ranking

Category	Quartile	Rank
Engineering - Safety, Risk, Reliability and Quality	Q2	#84/192
Engineering - Electrical and Electronic Engineering	Q3	#406/738
Engineering - Condensed Matter Physics	Q3	#248/423
Engineering - Surfaces, Coatings and Films	Q3	#78/131
Engineering - Atomic and Molecular Physics, and Optics	Q3	#126/211
Engineering - Electronic, Optical and Magnetic Materials	Q3	#168/271

Web of Science Core Collection

Science Citation Index Expanded (SCIE)	Social Sciences Citation Index (SSCI)
Indexed	-

Category (Journal Citation Reports 2023)	Quartile
ENGINEERING, ELECTRICAL & ELECTRONIC - SCIE	Q4
NANOSCIENCE & NANOTECHNOLOGY - SCIE	Q4
PHYSICS, APPLIED - SCIE	Q4

H-index

80

Country/Area of Publication

ENGLAND

Publisher

Elsevier Ltd

Publication Frequency

Monthly

Year Publication Started

1964

Annual Article Volume

329

Open Access

NO

Contact

PERGAMON-ELSEVIER SCIENCE LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OX5 1GB