Mobile ions entering the IGBT gate oxide - electrical detection and failure localization by lock-in thermography

Published 2023 View Full Article

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Title
Mobile ions entering the IGBT gate oxide - electrical detection and failure localization by lock-in thermography
Authors
Keywords
-
Journal
MICROELECTRONICS RELIABILITY
Volume 150, Issue -, Pages 115064
Publisher
Elsevier BV
Online
2023-10-02
DOI
10.1016/j.microrel.2023.115064
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