Impact of aging on the SEU immunity of FinFET-based embedded memory systems

Published 2023 View Full Article

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Title
Impact of aging on the SEU immunity of FinFET-based embedded memory systems
Authors
Keywords
-
Journal
MICROELECTRONICS RELIABILITY
Volume 150, Issue -, Pages 115229
Publisher
Elsevier BV
Online
2023-10-02
DOI
10.1016/j.microrel.2023.115229
References
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