Resistive switching study in HfO2 based resistive memories by conductive atomic force microscopy in vacuum
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Title
Resistive switching study in HfO2 based resistive memories by conductive atomic force microscopy in vacuum
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 124, Issue 1, Pages 014501
Publisher
AIP Publishing
Online
2018-07-02
DOI
10.1063/1.5025143
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