Resistive switching study in HfO2 based resistive memories by conductive atomic force microscopy in vacuum

Title
Resistive switching study in HfO2 based resistive memories by conductive atomic force microscopy in vacuum
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 124, Issue 1, Pages 014501
Publisher
AIP Publishing
Online
2018-07-02
DOI
10.1063/1.5025143

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started