Resistive switching study in HfO2 based resistive memories by conductive atomic force microscopy in vacuum
出版年份 2018 全文链接
标题
Resistive switching study in HfO2 based resistive memories by conductive atomic force microscopy in vacuum
作者
关键词
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出版物
JOURNAL OF APPLIED PHYSICS
Volume 124, Issue 1, Pages 014501
出版商
AIP Publishing
发表日期
2018-07-02
DOI
10.1063/1.5025143
参考文献
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