Resistive switching study in HfO2 based resistive memories by conductive atomic force microscopy in vacuum

标题
Resistive switching study in HfO2 based resistive memories by conductive atomic force microscopy in vacuum
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 124, Issue 1, Pages 014501
出版商
AIP Publishing
发表日期
2018-07-02
DOI
10.1063/1.5025143

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