Effect of O2 plasma treatment on density-of-states in a-IGZO thin film transistors

Performance enhancement in InZnO thin-film transistors with compounded ZrO 2 –Al 2 O 3 nanolaminate as gate insulators

(2016) Jianhua Zhang et al.   CERAMICS INTERNATIONAL

Silicon Nanowires for Solar Thermal Energy Harvesting: an Experimental Evaluation on the Trade-off Effects of the Spectral Optical Properties

(2016) Abdoul Karim Sekone et al.   Nanoscale Research Letters

Silicon Nanowires for Solar Thermal Energy Harvesting: an Experimental Evaluation on the Trade-off Effects of the Spectral Optical Properties

(2016) Abdoul Karim Sekone et al.   Nanoscale Research Letters

Tunneling phenomenon of amorphous indium-gallium-zinc-oxide thin film transistors for flexible display

(2015) Teresa Oh   Electronic Materials Letters

Electrical Properties and Reliability Analysis of Solution-Processed Indium Tin Zinc Oxide Thin Film Transistors with O2-Plasma Treatment

(2015) Sun Wook Ko et al.   JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY

IGZO thin film transistors with Al2O3 gate insulators fabricated at different temperatures

(2015) Xingwei Ding et al.   MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

Origin of electrical improvement of amorphous TaInZnO TFT by oxygen thermo-pressure-induced process

(2014) Byung Du Ahn et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Growth of IZO/IGZO dual-active-layer for low-voltage-drive and high-mobility thin film transistors based on an ALD grown Al2O3 gate insulator

(2014) Xingwei Ding et al.   SUPERLATTICES AND MICROSTRUCTURES

Suppression of temperature instability in InGaZnO thin-film transistors by in situ nitrogen doping

(2013) Jayapal Raja et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Effect of O 2 plasma immersion on electrical properties and transistor performance of indium gallium zinc oxide thin films

(2013) P. Liu et al.   THIN SOLID FILMS

Impact of Oxygen Plasma Treatment on the Device Performance of Zinc Oxide Nanoparticle-Based Thin-Film Transistors

(2012) Hendrik Faber et al.   ACS Applied Materials & Interfaces

High performance solution-deposited amorphous indium gallium zinc oxide thin film transistors by oxygen plasma treatment

(2012) Pradipta K. Nayak et al.   APPLIED PHYSICS LETTERS

Abnormal Subthreshold Leakage Current at High Temperature in InGaZnO Thin-Film Transistors

(2012) Geng-Wei Chang et al.   IEEE ELECTRON DEVICE LETTERS

The Deterioration of a-IGZO TFTs Owing to the Copper Diffusion after the Process of the Source/Drain Metal Formation

(2012) Ya-Hsiang Tai et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

N 2 O plasma treatment suppressed temperature-dependent sub-threshold leakage current of amorphous indium–gallium–zinc-oxide thin film transistors

(2012) Geng-Wei Chang et al.   SURFACE & COATINGS TECHNOLOGY

Effect of interface states on the instability under temperature stress in amorphous SiInZnO thin film transistor

(2011) Do Hyung Kim et al.   APPLIED PHYSICS LETTERS

Effect of channel thickness on density of states in amorphous InGaZnO thin film transistor

(2011) Sang Yeol Lee et al.   APPLIED PHYSICS LETTERS

Effect of oxygen partial pressure on electrical characteristics of amorphous indium gallium zinc oxide thin-film transistors fabricated by thermal annealing

(2011) C.J. Chiu et al.   VACUUM

High-Temperature Stability and Enhanced Performance of a-Si:H TFT on Flexible Substrate Due to Improved Interface Quality

(2010) Anil Indluru et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

The Effect of Density-of-State on the Temperature and Gate Bias-Induced Instability of InGaZnO Thin Film Transistors

(2010) Kwang Hwan Ji et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Role of Gallium Doping in Dramatically Lowering Amorphous-Oxide Processing Temperatures for Solution-Derived Indium Zinc Oxide Thin-Film Transistors

(2009) Sunho Jeong et al.   ADVANCED MATERIALS

Impact of device configuration on the temperature instability of Al–Zn–Sn–O thin film transistors

(2009) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Temperature-Dependent Transfer Characteristics of Amorphous InGaZnO4Thin-Film Transistors

(2009) Kazushige Takechi et al.   JAPANESE JOURNAL OF APPLIED PHYSICS